X-ray Fluorescence Spectrometry is an established non-destructive technique for rapid, multi-element analysis of bulk samples. Identification and quantitative estimation of almost any element from Boron to Uranium is possible at concentrations between 1ppm to 100%. The major advantages are minimum sample preparation, fast speed and good precision in analysis.
XRF spectrometry is one of the most widely used and versatile analytical technique. An XRF spectrometer normally uses primary radiation from an X-ray tube to excite secondary X-ray emission from a sample. The radiation emerging from the sample includes the characteristic X-ray peaks of major and trace elements present in the sample. Dispersion of these secondary X-ray into a spectrum, usually by X-ray diffraction, allows identification of these elements present in the sample. The height of each characteristic X-ray peaks relates to the concentration of the corresponding element in the sample, allowing quantitative analysis of the sample for most elements. The Solid samples are analysed in the form of pressed powder pellets or homogenised glass fused beeds.
Elements routinely determined as weight % oxide in geological matrices are SiO2, TiO2, Al2O3, Fe2O3(total), MnO, MgO, CaO, Na2O, K2O, and P2O5. Trace elements routinely determined in geological samples at > 5 ppm ( 2 ppm for some elements) level are Ba, Sc, V, Cr, Co, Ni, Cu, Zn, Ga, Pb, Th, Rb, U, Sr, Y, Zr and Nb .
Sample Requirement: In powder form (-200 mesh size). Quantity ~ 20 gm
- Automatic Hydraulic press ( 40 Ton) for making pressed powder pellet.
- Fusion beed preparation machine PAnalytical Perl.X 3.
- Planetary Ball Mill (Reitsch PM-100) for fine powdering.